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( Sold Out ) HITACHI - S-3000N Variable Pressure Scanning Electron Microscope (SEM)

( Sold Out ) HITACHI - S-3000N Variable Pressure Scanning Electron Microscope (SEM)
( Sold Out ) HITACHI - S-3000N Variable Pressure Scanning Electron Microscope (SEM)
  • Listing ID# 1700018
  • Manufacturer: ( Sold Out ) HITACHI -
  • Model: S-3000N Variable Pressure Scanning Electron Microscope (SEM)
  • Vintage:
  • Status: Refurbished

HITACHI S-3000N Variable Pressure Scanning Electron Microscope (SEM)                    
System sold refurbished with complete system parts and crating with 3 months warranty, ExWorks, Efab.

The list of system specifications :                     
1. Secondary electron image : 3.0 nm (at 25 kV, high vacuum mode)                    
2. BSE image : 4.5 nm (at 25 kV, variable pressure mode)                    
3. Magnification: x 15 ~ x 300,000 (65 steps)                    
4. Acceleration voltage: 0.3 ~ 30 kV                    
5. Variable pressure range : 1 ~ 270 Pa                    
6. Specimen size : 150 mm dia. ( maximum )                    
7. Image shift : ± 20 um ( at W.D. = 15 mm )                    
8. Electron gun : W (Tungsten) hairpin filament                    
9. Detectors : Secondary electron detector / BSE detector for VP-mode                    
10. Frame memory : 640 x 480pixels /1280 x 960 pixels