EFAB - Dimension 3100V Atomic Force Microscope

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Veeco Dimension 3100 Atomic Force Microscope (AFM) System consisting of:
 - Model: Dimension 3100V
- 6"/150mm Vacuum Wafer Chuck
- Stage with Enhanced Motorized Positioning and 125x100mm inspectable area
- di Nanoscope V Controller
- di Dimension 3100 Controller
- System Computer
- 1 Flat Panel Monitors
- Digital Instruments Keyboard and Mouse
- TMC Micro - G Isolation Table
- Light Tight Enclosure
- System Software
- CE Marked
- Operations Manuals and Documentation

More information available on request.