Veeco Dimension 3100 AFM

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Veeco Dimension 3100 Atomic Force Microscope (AFM) System consisting of:
 - Model: Dimension 3100S
- 6"/150mm Vacuum Wafer Chuck
- Stage with Enhanced Motorized Positioning and 125x100mm inspectable area
- Nanoscope 3D Controller
- Quadrex extender
- System Computer
- 2 Flat Panel Monitors
- Digital Instruments Keyboard and Mouse/Trackball
- TMC Micro-G Isolation Table
- Light Tight Enclosure
- System Software
- CE Marked
- Operations Manuals and Documentation

Note: Quadrex Extender adds the capability to bias the chuck and the tip at the same time.  This allows for Surface Potential, also called KPFM measurements, as well as phase, MFM and EFM scanning.